Magnetic Response Versus Lift Height of Thin Ferromagnetic Films

Authors

Tanner Schulz, University of Minnesota - Minneapolis
Gabe Burch, University of Minnesota - Minneapolis
Andrew Kunz, Marquette UniversityFollow
E. Dan Dahlberg, University of Minnesota - MinneapolisFollow

Document Type

Article

Language

eng

Format of Original

3 p.

Publication Date

6-2010

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Source Publication

IEEE Transactions on Magnetics

Source ISSN

0018-9464

Original Item ID

doi: 10.1109/TMAG.2009.2039701

Abstract

The interaction between a magnetic force microscope (MFM) tip and ferromagnetic films of Ni, Co₉₀Fe₁₀ and Py with in-plane magnetization has been investigated. The measured interaction, due to the magnetizing of the films by the MFM tip field, was determined by the phase shift of the cantilever response. The tip-film separation or lift height dependent phase shift was found to be independent of the saturation magnetization of the ferromagnetic film. The result is identical for all three films and micromagnetic simulations give similar results. The reason is at a given tip-sample separation the tip induced magnetization of the film creates a demagnetization field which is equal in magnitude to the tip field at that separation.

Comments

Published version. IEEE Transactions on Magnetics, Vol. 46, No. 6 (June 2010), DOI. © 2010 Institute of Electrical and Electronics Engineers. Used with permission.

Recommended Citation

Schulz, Tanner; Burch, Gabe; Kunz, Andrew; and Dahlberg, E. Dan, "Magnetic Response Versus Lift Height of Thin Ferromagnetic Films" (2010). Physics Faculty Research and Publications. 1.
https://epublications.marquette.edu/physics_fac/1