Date of Award

Summer 1950

Degree Type

Thesis - Restricted

Degree Name

Master of Science (MS)

Department

Physics

First Advisor

Barkow, Arthur G.

Second Advisor

Greene, J. B.

Third Advisor

Elo, A. E.

Abstract

Ordinarily, when one thinks of determining stresses in structural members, he is reminded of strain gauges, extensionmeters, and the associated massive testing machine that ordinarily accompanies such tests. Then too, such methods of testing materials are limited to the size of the machine and the item being tested, as well as to the strength of the machine. Whatever the mechanical device used, be it a strain gauge or an extensionometer to measure the strain, it will not differentiate between plastic and elastic strain. Any determination of the strain at a singular point, say the corner of a weld joint, must be determined by extrapolation. Men have long sought for a method to eliminate these undesirable shortcomings mentioned above. One of the purposes of this thesis is to acquaint the reader with a general knowledge of the use of X-ray diffraction as a means to determine stresses in crystalline solids. The material is presented in the logical order of procedure that would be expected in the development of a technique for the determination of stresses by X-ray diffraction. A complete description of the associated equipment is given, together with diagrams of the microphotometer used to analyze the diffraction patterns. A general knowledge of X-ray diffraction is assumed, together with some knowledge of crystal structure.

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