Date of Award
Thesis - Restricted
Master of Science (MS)
Mendelson, Kenneth S.
Electronic Speckle Pattern Interferometry (ESPI) is an optical measurement technique for analyzing the deformation of an object to obtain the displacement and strain. Compared to traditional optical measurements, it has several advantages since it uses a video system and image processing unit to replace photographic methods with their chemical processing and darkroom requirements. However a large amount of data processing is necessary to get the information. This thesis tries to solve this problem by developing a semi-automated data acquisition and processing program to ease the analysis procedure.
Zhang, Yongjun, "Automated Full-Displacement and Strain Analysis Using Electronic Speckle Pattern Interferometry" (1994). Master's Theses (1922-2009) Access restricted to Marquette Campus. 2347.