Date of Award

Spring 1944

Degree Type

Thesis - Restricted

Degree Name

Master of Science (MS)

Department

Chemistry

First Advisor

Koch, John R.

Abstract

Diffraction studies with x-rays give information concerning spatical periodicity within a substance since the scattering of x-rays by material depends on the arrangement of the atoms. The diffraction analysis yields information concerning the way the atoms are arranged in the ultimate particles of the material, the size of these particles and their arrangement in the mass. The x-ray diffraction of a crystalline substance provides a practical method of chemical analysis because the diffraction pattern can be used empirically as a unique identification of a substance without the personal factor.

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