American Institute of Physics
Applied Physics Letters
Original Item ID
A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>109 V=m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. The nanogap is fully isolated from the substrate eliminating growth mechanisms that involve substrate interactions. The proposed mechanism of ion transportation is verified using real-time imaging of the metal ion transportation using an in situ biasing in transmission electron microscope (TEM). The configuration of the micro/nanomachined suspended tips allows nanostructure growth of a wide variety of materials including metals, metal-oxides, and polymers. VC 2012 American Institute of Physics.
Han, Jun Hyun; Song, Kyung; Radhakrishnan, Shankar; Oh, Sang Ho; and Lee, Chung Hoon, "A Suspended Nanogap Formed by Field-Induced Atomically Sharp Tips" (2012). Electrical and Computer Engineering Faculty Research and Publications. 14.