Date of Award
Thesis - Restricted
Master of Science (MS)
A need has been found for an instrument which will allow for a more accurate picture of the variations in pattern around an x-ray diffraction ring. Comparisons of certain regions of interest on successive diffraction patterns of the same specimen under increasingly greater cycles of the same specimen under increasingly greater cycles of stress, for example, have in general been made by the naked eye. Thus minute variations in intensity and grain size may not be recognized. Furthermore, as another example, the eye can not very easily distinguish slight gradations in the blackening of a photographic film. Thus a more sensitive device is often needed to enable one to detect only slight amounts of preferred orientation in a stressed material. The purpose of this thesis was to design and build such an instrument; and finally, to use it to make more accurate determinations in some of the examples suggested above.
O'Connell, Thomas C., "X-Ray Diffraction Densitometer and Application to Interpretation of Diffraction Rings" (1948). Master's Theses (1922-2009) Access restricted to Marquette Campus. 2295.