Date of Award

Spring 1994

Degree Type

Thesis - Restricted

Degree Name

Master of Science (MS)



First Advisor

Matthys, Donald

Second Advisor

Karkheck, John

Third Advisor

Mendelson, Kenneth S.


Electronic Speckle Pattern Interferometry (ESPI) is an optical measurement technique for analyzing the deformation of an object to obtain the displacement and strain. Compared to traditional optical measurements, it has several advantages since it uses a video system and image processing unit to replace photographic methods with their chemical processing and darkroom requirements. However a large amount of data processing is necessary to get the information. This thesis tries to solve this problem by developing a semi-automated data acquisition and processing program to ease the analysis procedure.