Date of Award

Summer 1991

Document Type

Thesis - Restricted

Degree Name

Master of Science (MS)


Electrical and Computer Engineering

First Advisor

Brebrick, Robert F.

Second Advisor

Cartz, L.

Third Advisor

Blumenthal, R. N.


An attempt has been made to determine the tie-lines at 500° C in the HgCd-Te system using quantitative analysis with the help of energy dispersive X-ray analysis (EDAX) on a scanning electron microscope. The tie-lines were determined from bulk specimens equilibrated at 500° C. The solid solution composition was established and the liquid composition was estimated and using the gross-composition, tie-lines were drawn. The EDAX unit with Tracor Northern software attached to a JSM-35(JEOL) was calibrated and the analysis procedure which is completely standardized to yield consistent results is presented. The various input parameters are listed in the tables. A special reference standard obtained from Texas Instruments was used to verify the methodology and also the input parameters, including the mass-absorption coefficients. The spatial absorption function is presented for one of the specimens to indicate the activation volume from within which the X-rays are emitted. A sample quenched from the liquid state was analyzed to indicate possible causes for not attaining complete equilibrium. Microstructures are included which indicate some tellurium rich phases within the solid grains as well as some liquid entrapment.



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