Date of Award

Spring 1979

Document Type

Thesis - Restricted

Degree Name

Master of Science (MS)


Electrical and Computer Engineering

First Advisor

Stevens, E. Henry

Second Advisor

Jaskolski, Stanley V.

Third Advisor

Niederjohn, Russell J.


This thesis contains an analysis of the series resistance effects on MIS solar cells. Specifically, the effects of metal-film shut resistance on device performance were examined. A computer program was developed which calculated the current-voltage characteristics of a solar cell given physical dimensions, photocurrent, a leakage current table, and sheet resistance. Results of the model were compared to devices that were fabricated and tested in the laboratory. This comparison revealed that metal-film shut resistance was not the factor limiting device performance and that voltage drops across the interfacial oxide were important. After accounting for voltage drops across the oxide, agreement between computer-calculated and experimental current- voltage characteristics was very satisfactory. Consequently, it was concluded that interfacial oxide resistance is the factor limiting device performance and that the interfacial oxide requires further study if MIS solar cell performance is to be improved.



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