A Suspended Nanogap Formed by Field-Induced Atomically Sharp Tips

Authors

Jun Hyun Han, Marquette UniversityFollow
Kyung Song, Pohang University of Science and Technology
Shankar RadhakrishnanFollow
Sang Ho Oh, Pohang University of Science and Technology
Chung Hoon Lee, Marquette UniversityFollow

Document Type

Article

Language

eng

Publication Date

2012

Publisher

American Institute of Physics

Source Publication

Applied Physics Letters

Source ISSN

0003-6951

Original Item ID

doi: 10.1063/1.4764562

Abstract

A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>109 V=m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. The nanogap is fully isolated from the substrate eliminating growth mechanisms that involve substrate interactions. The proposed mechanism of ion transportation is verified using real-time imaging of the metal ion transportation using an in situ biasing in transmission electron microscope (TEM). The configuration of the micro/nanomachined suspended tips allows nanostructure growth of a wide variety of materials including metals, metal-oxides, and polymers. VC 2012 American Institute of Physics.

Comments

Published version. Applied Physics Letters, Vol. 101 (2012): 183106. Permalink. © 2012 American Institute of Physics. Used with permission.

Recommended Citation

Han, Jun Hyun; Song, Kyung; Radhakrishnan, Shankar; Oh, Sang Ho; and Lee, Chung Hoon, "A Suspended Nanogap Formed by Field-Induced Atomically Sharp Tips" (2012). Electrical and Computer Engineering Faculty Research and Publications. 14.
https://epublications.marquette.edu/electric_fac/14