Date of Award
Spring 1950
Document Type
Thesis - Restricted
Degree Name
Master of Science (MS)
Department
Physics
First Advisor
Barkow, Arthur G.
Second Advisor
Greene, J. B.
Third Advisor
Carroll, Joseph
Abstract
It has become increasingly evident that the properties of metals is closely related to the grain size and grain orientation of the metal. Intensive investigations into the relationships between the properties of metals and the grain size and orientation have been and are now an important part of the field of metallurgy. "These investigations require methods of determining the grain size in a metal and numerous procedures have been developed for doing so. In recent years, application of the field of x-ray diffraction to grain size measurements has become important. These x-ray methods usually involve a visual comparison or examination of a diffraction photograph; this limits the accuracy and reproducibility of the grain size determination as well as usually being a long tedious procedure. An obvious approach to the problem is the use of a densitometer for examination of the x-ray diffraction photograph and it is the purpose of this investigation to use a densitometer for the examination and correlation of the characteristics of a diffraction photograph with the grain size of the metal specimen. A specially built densitometer, designed to circumferentially scan a Debye-Scherrer ring of a diffraction photograph, is used to study the diffraction photographs. This will allow the examination and measurements of the characteristics of a densitometer trace as a method of grain size determination.
Recommended Citation
Jaggard, Robert A., "Grain Size Determination of Aluminum by X-Ray Diffraction" (1950). Master's Theses (1922-2009) Access restricted to Marquette Campus. 2287.
https://epublications.marquette.edu/theses/2287