Document Type

Conference Proceeding



Format of Original

8 p.

Publication Date



Institute of Electrical and Electronics Engineers (IEEE)

Source Publication

Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting

Source ISSN



This paper develops the foundations of a technique for detection and categorization of dynamic/static eccentricities and bar/end-ring connector breakages in squirrel-cage induction motors that is not based on the traditional Fourier transform frequency domain spectral analysis concepts, Hence, this approach can distinguish between the "fault signatures" of each of the following faults: eccentricities, broken bars, and broken end-ring connectors in such induction motors. Furthermore, the techniques presented here can extensively and economically predict and characterize faults from the induction machine adjustable speed drive design data without the need to have had actual fault data from field experience. This is done through the development of dual-track studies of fault simulations and hence simulated fault signature data. These studies are performed using our proven time stepping coupled finite element-state space method to generate fault case performance data, which contain phase current waveforms and time-domain torque profiles. The dual-track of generating fault data and mining fault signatures was tested here on dynamic and static eccentricities of 10% and 30% percent of airgap height as well as cases of 1, 3, 6, and 9 broken bars and 3, 6, and 9 broken end-ring connectors. These cases were studied for proof-of-principle in a 208-volt, 60-Hz, 4-pole, 1.2-hp, squirrel cage 3-phase induction motor. The paper presents faulty and healthy performance characteristics and their corresponding so-called phase space diagnoses that show distinct fault signatures of each of the faults.


Accepted version. Published as part of the proceedings of the Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting, 2001: 1579-1586. DOI. © 2001 Institute of Electrical and Electronic Engineers (IEEE). Used with permission.

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