Institute of Electrical and Electronic Engineers (IEEE)
IEEE Photonics Technology Letters
We report an extension of the analytical dead space multiplication theory that provides the means to theoretically determine the spatial distribution of electron and hole impact-ionization events in an arbitrarily specified heterojunction multiplication region. The model can be used to understand the role of the dead space in regularizing the locations of impact ionization. It can also be utilized to analyze, design, and optimize new generations of ultra-low noise, multistaged gain avalanche photodiodes based upon judiciously energizing and relaxing carriers to enhance electron impact ionization and suppress hole impact ionization.
Ramirez, David A.; Hayat, Majeed M.; Huntington, Andrew S.; and Williams, George M., "Non-Local Model for the Spatial Distribution of Impact Ionization Events in Avalanche Photodiodes" (2014). Electrical and Computer Engineering Faculty Research and Publications. 563.
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