Computation of Bit-Error Probabilities for Optical Receivers Using Thin Avalanche Photodiodes

Authors

Byonghyok Choi, Florida University
Majeed M. Hayat, Marquette UniversityFollow

Document Type

Article

Language

eng

Publication Date

1-2006

Publisher

Institute of Electrical and Electronic Engineers (IEEE)

Source Publication

IEEE Communications Letters

Source ISSN

1089-7798

Abstract

The large-deviation-based asymptotic-analysis and importance-sampling methods for computing bit-error probabilities for avalanche-photodiode (APD) based optical receivers, developed by Letaief and Sadowsky [IEEE Trans. Inform. Theory, vol. 38, pp. 1162-1169, 1992], are extended to include the effect of dead space, which is significant in high-speed APDs with thin multiplication regions. It is shown that the receiver's bit-error probability is reduced as the magnitude of dead space increases relative to the APD's multiplication-region width. The calculated error probabilities and receiver sensitivities are also compared with those obtained from the Chernoff bound.

Comments

Accepted version. IEEE Communications Letters, Vol. 10, No. 1 (January 2006): 56-58. DOI. © 2006 Institute of Electrical and Electronic Engineers (IEEE). Used with permission.

Recommended Citation

Choi, Byonghyok and Hayat, Majeed M., "Computation of Bit-Error Probabilities for Optical Receivers Using Thin Avalanche Photodiodes" (2006). Electrical and Computer Engineering Faculty Research and Publications. 593.
https://epublications.marquette.edu/electric_fac/593