Document Type
Conference Proceeding
Language
eng
Format of Original
4 p.
Publication Date
10-2011
Publisher
Institute of Electrical and Electronics Engineers
Source Publication
IEEE Nuclear Science Symposium and Medical Imaging Conference Record
Source ISSN
1082-3654
Original Item ID
doi: 10.1109/NSSMIC.2011.6152786
Abstract
Single Photon Emission Computed Tomography (SPECT) systems are being developed with multiple cameras and without gantry rotation to provide rapid dynamic acquisitions. However, the resulting data is angularly undersampled, due to the limited number of views. We propose a novel reconstruction algorithm for sparse-view SPECT based on Compressed Sensing (CS) theory. The algorithm models Poisson noise by modifying the Iterative Hard Thresholding algorithm to minimize the Kullback-Leibler (KL) distance by gradient descent. Because the underlying objects of SPECT images are expected to be smooth, a discrete wavelet transform (DWT) using an orthogonal spline wavelet kernel is used as the sparsifying transform. Preliminary feasibility of the algorithm was tested on simulated data of a phantom consisting of two Gaussian distributions. Single-pinhole projection data with Poisson noise were simulated at 128, 60, 15, 10, and 5 views over 360 degrees. Image quality was assessed using the coefficient of variation and the relative contrast between the two objects in the phantom. Overall, the results demonstrate preliminary feasibility of the proposed CS algorithm for sparse-view SPECT imaging.
Recommended Citation
Wolf, Paul Arthur; Sidky, Emil Y.; and Schmidt, Taly Gilat, "A Compressed Sensing Algorithm for Sparse-View Pinhole Single Photon Emission Computed Tomography" (2011). Biomedical Engineering Faculty Research and Publications. 80.
https://epublications.marquette.edu/bioengin_fac/80
Comments
Accepted version. Published as part of the proceedings of the conference, 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011: 2668-2671. DOI. © 2011 Institute of Electrical and Electronics Engineers (IEEE). Used with permission.