Document Type
Article
Language
eng
Format of Original
10 p.
Publication Date
12-2008
Publisher
Institute of Electrical and Electronics Engineers
Source Publication
IEEE Transactions on Energy Conversion
Source ISSN
0885-8969
Original Item ID
doi: 10.1109/TEC.2008.2001443
Abstract
The benefits and drawbacks of a 5-hp reconfigurable induction motor, which was designed for experimental emulation of stator winding interturn and broken rotor bar faults, are presented in this paper. It was perceived that this motor had the potential of quick and easy reconfiguration to produce the desired stator and rotor faults in a variety of different fault combinations. Hence, this motor was anticipated to make a useful test bed for evaluation of the efficacy of existing and new motor fault diagnostics techniques and not the study of insulation failure mechanisms. Accordingly, it was anticipated that this reconfigurable motor would eliminate the need to permanently destroy machine components such as stator windings or rotor bars when acquiring data from a faulty machine for fault diagnostic purposes. Experimental results under healthy and various faulty conditions are presented in this paper, including issues associated with rotor bar-end ring contact resistances that showed the drawbacks of this motor in so far as emulation of rotor bar breakages. However, emulation of stator-turn fault scenarios was successfully accomplished.
Recommended Citation
Yeh, Chia-Chou; Sizov, Gennadi Y.; Sayed-Ahmed, Ahmed; Demerdash, Nabeel; Povinelli, Richard J.; Yaz, Edwin E.; and Ionel, Dan M., "A Reconfigurable Motor for Experimental Emulation of Stator Winding Inter-Turn and Broken Bar Faults in Polyphase Induction Machines (Journal article)" (2008). Electrical and Computer Engineering Faculty Research and Publications. 111.
https://epublications.marquette.edu/electric_fac/111
ADA Accessible Version
Comments
Accepted version. IEEE Transactions on Energy Conversion, Vol. 23, No. 4 (December 2008): 1005-1014. DOI. © 2008 The Institute of Electrical and Electronics Engineers. Used with permission.