Document Type
Conference Proceeding
Language
eng
Format of Original
6 p.
Publication Date
11-2-2004
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Source Publication
2004 International Conference on Power System Technology (PowerCon 2004)
Source ISSN
0-7803-8610-8
Abstract
An effective technique for diagnosis of stator winding inter-turn shorts in induction motors fed by PWM-inverter drive systems is proposed. This is done through the use of a time-series data mining technique which identifies and extracts hidden and inherent patterns (characteristics) in the machine phase currents, that can be used for fault identification. This technique can effectively detect and determine the severity of stator inter-turn faults in motors by analyzing the extracted fault signatures of these faults in comparison with the healthy performance signatures. In addition, it will be seen from the experimental results that the proposed technique is immune to motor "non-idealities" such as inherent manufacture-based motor asymmetry due to motor structural imperfections, performance measurement imperfections, and supply voltage unbalances, which result in departure of performance results from those of an ideally balanced 3-phase machine. In this paper, the case-study under investigation is a 230-volt, 60-Hz, 2-pole, 2-hp, squirrel-cage three-phase induction motor-drive system. The experimental results will demonstrate the soundness and robustness of this technique for reliable fault diagnostics.
Recommended Citation
Yeh, Chiachou; Povinelli, Richard J.; Mirafzal, Behrooz; and Demerdash, Nabeel, "Diagnosis of Stator Winding Inter-Turn Shorts in Induction Motors Fed by PWM-Inverter Drive Systems Using a Time-Series Data Mining Technique" (2004). Electrical and Computer Engineering Faculty Research and Publications. 161.
https://epublications.marquette.edu/electric_fac/161
Comments
Accepted version. Published as part of the proceedings of the conference, 2004 International Conference on Power System Technology (PowerCon 2004): 891-896. DOI. © 2004 The Institute of Electrical and Electronics Engineers. Used with permission.