Document Type
Article
Language
eng
Publication Date
6-23-2014
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Source Publication
Journal of Microelectromechanical Systems
Source ISSN
1057-7157
Abstract
In this paper, a microelectromechanical systems cantilever sensor was designed, modeled, and fabricated to measure the photoacoustic (PA) response of gases under very low vacuum conditions. The micromachined devices were fabricated using silicon-on-insulator wafers and then tested in a custom-built, miniature, vacuum chamber during this first-ever demonstration. Terahertz radiation was amplitude modulated to excite the gas under test and perform PA molecular spectroscopy. Experimental data show a predominantly linear response that directly correlates measured cantilever deflection to PA signals. Excellent low pressure (i.e., 2-40 mTorr) methyl cyanide PA spectral data were collected resulting in a system sensitivity of 1.97 × 10 -5 cm -1 and a normalized noise equivalent absorption coefficient of 1.39 × 10 -9 cm -1 W Hz -1/2 .
Recommended Citation
Giauvitz, Nathan E.; Coutu, Ronald A. Jr.; Medvedev, Ivan R.; and Petkie, Douglas T., "Terahertz Photoacoustic Spectroscopy Using an MEMS Cantilever Sensor" (2014). Electrical and Computer Engineering Faculty Research and Publications. 335.
https://epublications.marquette.edu/electric_fac/335
ADA accessible version
Comments
Accepted version. Journal of Microelectromechanical Systems, Vol. 24, No. 1 (February 2015): 218-223. DOI. © 2015 IEEE. Used with permission.
Ronald A. Coutu was affiliated with the Air Force Institute of Technology, Wright-Patterson Airforce Base, OH at the time of publication.