Micro-Contact Performance and Reliability Under Low Frequency, Low Amplitude, Alternating Current (AC) Test Conditions

Authors

C. H. Kodama, Air Force Institute of Technology
Ronald A. Coutu Jr., Marquette UniversityFollow

Document Type

Conference Proceeding

Language

eng

Publication Date

12-3-2015

Publisher

Institute of Electrical and Electronic Engineers (IEEE)

Source Publication

2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS)

Source ISSN

9781467393416

Abstract

Metamaterials in the terahertz range or higher typically have gaps that are far from an ideal parallel plate due to microfabrication limitations on feature size. This work examines the exact solution to the square parallel plate capacitor and finds a valid approximation for capacitance in non-ideal geometries, when the gap size is comparable or larger than the dimensions of the plates.

Comments

Accepted version. Published as a part of 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), Accession Number: 15637121 (September 7-12, 2015). DOI. © 2015 Institute of Electrical and Electronic Engineers (IEEE). Used with permission.

Ronal A. Coutu was affiliated with Air Force Institute of Technology at the time of publication.

Recommended Citation

Kodama, C. H. and Coutu, Ronald A. Jr., "Micro-Contact Performance and Reliability Under Low Frequency, Low Amplitude, Alternating Current (AC) Test Conditions" (2015). Electrical and Computer Engineering Faculty Research and Publications. 408.
https://epublications.marquette.edu/electric_fac/408