Document Type
Article
Language
eng
Publication Date
2012
Publisher
Elsevier
Source Publication
Procedia Engineering
Source ISSN
1877-7058
Abstract
Metal-insulator transition (MIT) phase-change materials (PCM) are material compounds that have the ability to be either conductors or insulators depending on external stimuli. A micromachined test structure for applying external electric fields across MIT wire segments was designed and fabricated. Using this novel test structure, Germanium Telluride (GeTe) and Vanadium Oxide (VOx) were successfully transitioned from a conductor to an insulator. The resistivity of the GeTe wire segments increased three to five orders of magnitude with ∼40 V applied to the parallel plates of the test structure. The VOx wires exhibited an order of magnitude transition in resistivity with ∼20 V applied. Characterization of both RF and DC switching performance of these MIT wire segments was completed and GeTe and VOx appear to be viable materials for micro-switching.
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License.
Recommended Citation
Danner, Brent L. and Coutu, Ronald A. Jr., "Characterizing Metal-Insulator-Transition (MIT) Phase Change Materials (PCM) for RF and DC Micro-switching Elements" (2012). Electrical and Computer Engineering Faculty Research and Publications. 413.
https://epublications.marquette.edu/electric_fac/413
ADA accessible version
Comments
Published version. Procedia Engineering, Vol. 47 (2012): 80-86. DOI. © 2012 The Authors. Published by Elsevier Ltd. Selection and/or peer-review under responsibility of the Symposium Cracoviense Sp. z.o.o. Open access under CC BY-NC-ND license.
Ronald A. Coutu, Jr. was affiliated with the Air Force Institute of Technology at the time of publication.