Document Type

Article

Language

eng

Publication Date

2005

Publisher

Institute of Electrical and Electronic Engineers (IEEE)

Source Publication

IEEE Photonics Technology Letters

Source ISSN

1041-1135

Abstract

A channel-capacity metric is introduced for assessing the performance of single-photon avalanche photodiodes (SPADs) when used as detectors in laser communication systems. This metric is employed to theoretically optimize, with respect to the device structure and operating voltage, the performance of SPADs with simple InP or In/sub 0.52/Al/sub 0.48/As-InP heterojunction multiplication regions. As the multiplication-region width increases, an increase is predicted in both the peak and the full-width at half-maximum of the channel capacity curve versus the normalized excess voltage. Calculations also show the existence of an optimal In/sub 0.52/Al/sub 0.48/As-InP heterojunction multiplication region that maximizes the peak channel capacity beyond that of InP.

Comments

Accepted version. IEEE Photonics Technology Letters, Vol. 17, No. 10 (2005): 2164-2166. DOI. © 2005 Institute of Electrical and Electronic Engineers (IEEE). Used with permission.

Majeed M. Hayat was affiliated with University of New Mexico, Albuquerque at the time of publication.

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