Document Type
Article
Publication Date
3-2022
Publisher
Institute of Electrical and Electronic Engineers
Source Publication
IEEE Transactions on Industrial Electronics
Source ISSN
0278-0046
Original Item ID
DOI: 10.1109/TIE.2021.3065617
Abstract
An online approach for diagnosing high-resistance connection (HRC) faults in five-phase permanent magnet synchronous motor drives is presented in this article. The development of this approach is based on a so-called “magnetic field pendulous oscillation (MFPO)” technique and symmetrical components method. Under HRC fault condition, a “swing-like” MFPO phenomenon is observed compared to the healthy condition. Furthermore, with the extracted current features in symmetrical components domain, different HRC fault types are successfully identified and distinguished. These fault types include single-phase faults, e.g., HRC fault in phase-A; two-phase nonadjacent faults, e.g., HRC fault in phase-A&C; and two-phase adjacent faults, e.g., HRC fault in phase-A&B. Meanwhile, the localization of the faulty phase/phases is also accomplished, and the fault severity is estimated. In this approach, only sensing of the phase currents is needed. Hence, the implementation cost is very low since the sensory data of the currents are typically already available in the closed-loop vector-controlled drives for control purpose and no additional sensors or related signal conditioning circuits are required. The effectiveness of the presented diagnostic approach is verified by simulations and experimental results.
Recommended Citation
Chen, Hao; He, Jiangbiao; Guan, Xing; Demerdash, Nabeel; EL-Refaie, Ayman M.; and Lee, Christopher H.T., "High-Resistance Connection Diagnosis in Five-Phase PMSMs Based on the Method of Magnetic Field Pendulous Oscillation and Symmetrical Components" (2022). Electrical and Computer Engineering Faculty Research and Publications. 746.
https://epublications.marquette.edu/electric_fac/746
ADA Accessible Version
Comments
Accepted version. IEEE Transactions on Industrial Electronics, Vol 69, No. 3 (March 2022): 2288-2299. DOI. © 2022 Institute of Electrical and Electronic Engineers (IEEE). Used with permission.