"Fault Equivalence and Signal Reliability In Combinational Circuits" by John Yung Teng
 

Date of Award

4-1976

Degree Type

Master's Essay - Restricted

Degree Name

Master of Science (MS)

Department

Mathematics, Statistics and Computer Science

Abstract

This essay describes the effects of "stuck-at" faults on the structural and functional characteristics of combinational logic networks. R-equivalence, S-equivalence, and functional equivalence are defined. The ''structure --- and parity - observing output function'' (SPOOF) for combinational circuits provides a convenient way to get the fault function. This essay develops two simple algorithms for calculating the probability that the output of the circuit is 1 given the probabilities for each input being 1.

Comments

An essay summitted to the faculty of the Graduate School , Marquette University , in Partial Fulfillment of the Requirements for the Degree of Master of Science, Milwaukee , Wisconsin.

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