Admittance Selection for Planar Force-Guided Assembly for Single-Point Contact with Friction

Authors

Shuguang Huang, Marquette UniversityFollow
Joseph M. Schimmels, Marquette UniversityFollow

Document Type

Conference Proceeding

Language

eng

Publication Date

9-14-2003

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Source Publication

Proceedings. ICRA '03. IEEE International Conference on Robotics and Automation, 2003

Source ISSN

1050-4729

Abstract

This paper identifies procedures for selecting the appropriate admittance to achieve reliable planar force-guided assembly for single-point frictional contact cases. A set of conditions that are imposed on the admittance matrix is presented. These conditions ensure that the motion that results from contact reduces part misalignment. We show that, for bounded misalignments, if an admittance satisfies the misalignment-reduction conditions at a finite number of contact configurations and a given coefficient of friction /spl mu//sub M/) then the admittance will also ensure that the conditions are satisfied at all intermediate configurations for all coefficients less than /spl mu//sub M/.

Comments

Accepted version. Published as a part of the Proceedings. ICRA '03. IEEE International Conference on Robotics and Automation, 2003. DOI. © 2003 IEEE. Used with permission.

Recommended Citation

Huang, Shuguang and Schimmels, Joseph M., "Admittance Selection for Planar Force-Guided Assembly for Single-Point Contact with Friction" (2003). Mechanical Engineering Faculty Research and Publications. 111.
https://epublications.marquette.edu/mechengin_fac/111