Date of Award
Spring 1965
Document Type
Thesis - Restricted
Degree Name
Master of Science (MS)
Department
Mechanical Engineering
First Advisor
Hirthe, Walter M.
Second Advisor
Richardson, B. L.
Third Advisor
Wackman, Peter
Abstract
The best technique for observing lattice defects such as dislocations and stacking faults in transmission electron microscopy. This technique requires a thin film about 1000A thick of the material to be investigated. Metallic films are usually prepared by an electrothinning technique, but this method is not suitable for the preparation of metal oxide specimens. This research was undertaken with the intention to develop a specimen preparation technique and to observe the imperfections, such as dislocations and stacking faults in single crystal rutile.
Recommended Citation
Bapna, M. S., "Preparation of a Thin Specimen of Rutile for Transmission Electron Microscopy" (1965). Master's Theses (1922-2009) Access restricted to Marquette Campus. 3950.
https://epublications.marquette.edu/theses/3950