Date of Award

Summer 1971

Document Type

Thesis - Restricted

Degree Name

Master of Science (MS)

Department

Mechanical and Industrial Engineering

First Advisor

Cartz, Louis

Second Advisor

Ehlert, Thomas

Third Advisor

Hirthe, Walter

Abstract

This study will mainly concern itself with the relationships between atomic structure and thermal expansion as measured by diffraction methods. The closely related property of compressibility will also be discussed to some extent, although the primary emphasis will be on the thermal expansion behavior of materials. As this thesis may be read by students with relatively little background in either diffraction or thermal expansion properties, many of the sections have been formulated from basic principles. The literature review on thermal expansion is not intended to be a complete, detailed study; nevertheless, it does cover an extensive area.

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