Format of Original
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Magnetics
Original Item ID
The interaction between a magnetic force microscope (MFM) tip and ferromagnetic films of Ni, Co90Fe10 and Py with in-plane magnetization has been investigated. The measured interaction, due to the magnetizing of the films by the MFM tip field, was determined by the phase shift of the cantilever response. The tip-film separation or lift height dependent phase shift was found to be independent of the saturation magnetization of the ferromagnetic film. The result is identical for all three films and micromagnetic simulations give similar results. The reason is at a given tip-sample separation the tip induced magnetization of the film creates a demagnetization field which is equal in magnitude to the tip field at that separation.
Schulz, Tanner; Burch, Gabe; Kunz, Andrew; and Dahlberg, E. Dan, "Magnetic Response Versus Lift Height of Thin Ferromagnetic Films" (2010). Physics Faculty Research and Publications. 1.