Localized Ferromagnetic Resonance in Inhomogeneous Thin Films

Authors

R. D. McMichael, National Institute of Standards & Technology
D. J. Twisselmann, National Institute of Standards & Technology
Andrew Kunz, Marquette UniversityFollow

Document Type

Article

Language

eng

Publication Date

6-2003

Publisher

American Physical Society

Source Publication

Physical Review Letters

Source ISSN

0031-9007

Abstract

The effect of sample inhomogeneity on the ferromagnetic resonance linewidth is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities spanning a wide range of characteristic length scales. A model inhomogeneity is used that consist of size D grains and an anisotropy field H_p that varies randomly from grain to grain in a film with thickness d and magnetization M_s. The resulting linewidth agrees well with the two-magnon model for small inhomogeneity, H_pD « πM_sd. For large inhomogeneity, H_pD » πM_sd the precession becomes localized and the spectrum approaches that of local precession on independent grains.

Comments

Published version. Physical Review Letters, Vol. 90, No. 22 (June 2003). DOI. © 2003 American Physical Society. Used with permission.

Recommended Citation

McMichael, R. D.; Twisselmann, D. J.; and Kunz, Andrew, "Localized Ferromagnetic Resonance in Inhomogeneous Thin Films" (2003). Physics Faculty Research and Publications. 133.
https://epublications.marquette.edu/physics_fac/133