Eigen Modes and Ferromagnetic Resonance Line Width of Inhomogeneous Thin Films

Authors

R. D. McMichael, National Institute of Standards & Technology
Andrew Kunz, Marquette UniversityFollow
D. J. Twisselmann, National Institute of Standards & Technology

Document Type

Conference Proceeding

Language

eng

Publication Date

3-30-2003

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Source Publication

2003 IEEE International Magnetics Conference (INTERMAG)

Source ISSN

0780376471

Abstract

In this paper, we describe modeling of the effects of magnetic inhomogeneity on ferromagnetic resonance line width using eigen mode analyses of inhomogeneous thin magnetic films.

Comments

Accepted version. Published as a part of the 2003 IEEE International Magnetics Conference (INTERMAG). DOI. © 2003 IEEE. Used with permission.

Andrew Kunz was affiliated with Lawrence University at the time of publication.

Recommended Citation

McMichael, R. D.; Kunz, Andrew; and Twisselmann, D. J., "Eigen Modes and Ferromagnetic Resonance Line Width of Inhomogeneous Thin Films" (2003). Physics Faculty Research and Publications. 141.
https://epublications.marquette.edu/physics_fac/141