Title

Eigen Modes and Ferromagnetic Resonance Line Width of Inhomogeneous Thin Films

Document Type

Conference Proceeding

Language

eng

Publication Date

3-30-2003

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Source Publication

2003 IEEE International Magnetics Conference (INTERMAG)

Source ISSN

0780376471

Abstract

In this paper, we describe modeling of the effects of magnetic inhomogeneity on ferromagnetic resonance line width using eigen mode analyses of inhomogeneous thin magnetic films.

Comments

Published as a part of the 2003 IEEE International Magnetics Conference (INTERMAG). DOI.

Andrew Kunz was affiliated with Lawrence University at the time of publication.

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