Institute of Electrical and Electronics Engineers (IEEE)
2003 IEEE International Magnetics Conference (INTERMAG)
In this paper, we describe modeling of the effects of magnetic inhomogeneity on ferromagnetic resonance line width using eigen mode analyses of inhomogeneous thin magnetic films.
McMichael, R. D.; Kunz, Andrew; and Twisselmann, D. J., "Eigen Modes and Ferromagnetic Resonance Line Width of Inhomogeneous Thin Films" (2003). Physics Faculty Research and Publications. 141.
ADA Accepted Version
Accepted version. Published as a part of the 2003 IEEE International Magnetics Conference (INTERMAG). DOI. © 2003 IEEE. Used with permission.
Andrew Kunz was affiliated with Lawrence University at the time of publication.